IEC 62526-2007 半导体设计环境用标准试验接口语言(STIL)扩展标准
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【英文标准名称】:StandardforextensionstoStandardTestInterfaceLanguage(STIL)forsemiconductordesignenvironments
【原文标准名称】:半导体设计环境用标准试验接口语言(STIL)扩展标准
【标准号】:IEC62526-2007
【标准状态】:现行
【国别】:国际
【发布日期】:2007-11
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC93
【标准类型】:()
【标准水平】:()
【中文主题词】:建筑(IT);自动化;计算机协助工程;加算机软件协助工程;数据处理;定义;数字的;信息交流;信息技术;集成电路;接口;测绘;产品设计;自我检验;半导体设备;半导体;试验类型;测试程序;试验;试验环境;试验设备
【英文主题词】:Architecture(IT);Automation;CAE;CASE;Computeraidedengineering;Computeraidedsoftwareengineering;Datahandling;Dataprocessing;Definition;Definitions;Digital;Informationinterchange;Informationtechnology;Integratedcircuits;Interfaces;Mapping;Productdesign;Self-checking;Semiconductordevices;Semiconductors;Testpattern;Testprocedures;Testing;Testingconditions;Testingdevices
【摘要】:StructuresaredefinedinSTILtosupportusageassemiconductorsimulationstimulus,including(1)mappingsignalnamestoequivalentdesignreferences,(2)interfacebetweenscanandbuilt-inselftest(BIST)andthelogicsimulation,(3)datatypestorepresentunresolvedstatesinapattern,(4)parallelorasynchronouspatternexecutionondifferentdesignblocks,and(5)expression-basedconditionalexecutionofpatternconstructs.StructuresaredefinedinSTILtosupportthedefinitionoftestpatternsforsub-blocksofadesign4(i.e.,embeddedcores)suchthatthesetestscanbeincorporatedintoacompletehigherleveldevicetest.StructuresaredefinedinSTILtorelatefailinformationfromdevicetestingenvironmentsbacktooriginalstimulusanddesigndataelements.
【中国标准分类号】:L74
【国际标准分类号】:25_040
【页数】:126P.;A4
【正文语种】:英语
【原文标准名称】:半导体设计环境用标准试验接口语言(STIL)扩展标准
【标准号】:IEC62526-2007
【标准状态】:现行
【国别】:国际
【发布日期】:2007-11
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC93
【标准类型】:()
【标准水平】:()
【中文主题词】:建筑(IT);自动化;计算机协助工程;加算机软件协助工程;数据处理;定义;数字的;信息交流;信息技术;集成电路;接口;测绘;产品设计;自我检验;半导体设备;半导体;试验类型;测试程序;试验;试验环境;试验设备
【英文主题词】:Architecture(IT);Automation;CAE;CASE;Computeraidedengineering;Computeraidedsoftwareengineering;Datahandling;Dataprocessing;Definition;Definitions;Digital;Informationinterchange;Informationtechnology;Integratedcircuits;Interfaces;Mapping;Productdesign;Self-checking;Semiconductordevices;Semiconductors;Testpattern;Testprocedures;Testing;Testingconditions;Testingdevices
【摘要】:StructuresaredefinedinSTILtosupportusageassemiconductorsimulationstimulus,including(1)mappingsignalnamestoequivalentdesignreferences,(2)interfacebetweenscanandbuilt-inselftest(BIST)andthelogicsimulation,(3)datatypestorepresentunresolvedstatesinapattern,(4)parallelorasynchronouspatternexecutionondifferentdesignblocks,and(5)expression-basedconditionalexecutionofpatternconstructs.StructuresaredefinedinSTILtosupportthedefinitionoftestpatternsforsub-blocksofadesign4(i.e.,embeddedcores)suchthatthesetestscanbeincorporatedintoacompletehigherleveldevicetest.StructuresaredefinedinSTILtorelatefailinformationfromdevicetestingenvironmentsbacktooriginalstimulusanddesigndataelements.
【中国标准分类号】:L74
【国际标准分类号】:25_040
【页数】:126P.;A4
【正文语种】:英语
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